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Advanced Metrology

Products

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CT 150

Compact metrology system for production or advanced R&D with a scanning area of 150 x 150 mm²

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CT 300

Versatile Metrology System for Production & Laboratory with a scanning area of up to 315 x 315 mm².

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CT 350

Versatile Metrology System for Production & Laboratory with a scanning area of up to 350x 350 mm².​

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CT 350T

Double-Sided Metrology System for Production and Laboratory use, measuring absolute thickness and top/bottom surfaces in one scan, on areas up to 329 x 329 mm².

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CT 450G

Advanced Metrology System for large and heavy parts in production or R&D.

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CT 600S

Leading accuracy on larger scale for samples up to 650 x 650 mm² and beyond.

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CT 600ST

Double-Sided Metrology System for large parts up to 600 x 600 mm².

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Full Automated

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AL 200S

Fully automated wafer metrology with single or double-sided measurement capabilities, complete with seamless handling. Enhance precision and efficiency in your wafer processing and boost your Yield.

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AL 200D

Fully automated wafer metrology solution, featuring high-throughput, dual-arm handling and both single and double-sided measurement capabilities with two simultaneously measuring metrology cells. Designed for precision and efficiency, this system streamlines your wafer processing.

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